Title:  Investigating the Reliability and Circuit-Relevant Operational Limits of Highly-Scaled Silicon Germanium Heterojunction Bipolar Transistors in Extreme Environments

Committee:

Dr. John Cressler, ECE, Chair, Advisor

Dr. Farrokh Ayazi, ECE

Dr. Dragomir Davidovic, Physics

Dr. Nima Ghalichechian, ECE

Dr. Asif Khan, ECE